Filtros : "IF" "RAIOS X" "ALVES, CÁSSIO" Limpar


  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: RAIOS X, MACROMOLÉCULA

    Versão PublicadaAcesso à fonteAcesso à fonteDOIHow to cite
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    • ABNT

      ALVES, Cássio e PEDERSEN, Jan Skov e OLIVEIRA, Cristiano Luis Pinto de. Modelling of high-symmetry nanoscale particles by small-angle scattering. Journal of Applied Crystallography, v. 47, n. ja 2014, p. 84-94, 2014Tradução . . Disponível em: https://doi.org/10.1107/S1600576713028549. Acesso em: 27 abr. 2024.
    • APA

      Alves, C., Pedersen, J. S., & Oliveira, C. L. P. de. (2014). Modelling of high-symmetry nanoscale particles by small-angle scattering. Journal of Applied Crystallography, 47( ja 2014), 84-94. doi:10.1107/S1600576713028549
    • NLM

      Alves C, Pedersen JS, Oliveira CLP de. Modelling of high-symmetry nanoscale particles by small-angle scattering [Internet]. Journal of Applied Crystallography. 2014 ; 47( ja 2014): 84-94.[citado 2024 abr. 27 ] Available from: https://doi.org/10.1107/S1600576713028549
    • Vancouver

      Alves C, Pedersen JS, Oliveira CLP de. Modelling of high-symmetry nanoscale particles by small-angle scattering [Internet]. Journal of Applied Crystallography. 2014 ; 47( ja 2014): 84-94.[citado 2024 abr. 27 ] Available from: https://doi.org/10.1107/S1600576713028549

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